MACS/D (Magnetic Active Compensation System) for Electron Microscopy
MACS/D for electron microscopy stabilizes ultra-sensitive instruments by actively correcting environmental magnetic interference across all axes for consistent, high-resolution imaging performance.
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Advanced Magnetic Compensation for Electron Microscopy
MACS/D for electron microscopy is engineered to protect high-resolution charged-beam instruments from performance-degrading magnetic interference. Its digital signal processing architecture provides rapid, low-noise compensation across a wide frequency range, enabling instruments to operate at peak stability even in challenging environments. The system supports flexible coil geometries and includes ACR technology, allowing the probe to be positioned away from interfering sources without sacrificing attenuation.
Key benefits include:
- High-power, three-axis compensation for extreme EMI environments
- Ultra-low latency DSP engine for precise, real-time corrections
- Secure remote access with monitoring, diagnostics, and data logging
- Wide dynamic range for sites with fluctuating or high-amplitude magnetic fields
This robust platform delivers long-term performance, flexible integration, and superior protection for microscopes and other sensitive electron-beam systems.
